CIE x048-OP43
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ACCURATE MEASUREMENT OF ULTRAVIOLET LIGHT- EMITTING DIODES
Published by | Publication Date | Number of Pages |
CIE | 09/29/2021 | 6 |
CIE x048-OP43 – ACCURATE MEASUREMENT OF ULTRAVIOLET LIGHT- EMITTING DIODES
We have developed a new calibration capability for 200 nm to 400 nm ultraviolet light-emitting diodes (UV LEDs) using a Type D gonio-spectroradiometer. The recently-introduced mean differential continuous pulse (M-DCP) method is used to overcome the measurement difficulty associated with the initial forward voltage, VF, anomaly of a UV LED, which makes it impossible to use VF to infer junction temperature, TJ, during pulsed operation. The new measurement facility was validated indirectly by comparing the measured total luminous flux of a white LED with that measured using the NISTs 2.5 m absolute integrating sphere. The expanded calibration uncertainty for the total radiant flux is approximately 2 % to 3 % (k = 2) depending the wavelength of the UV LED.
Product Details
- Published:
- 09/29/2021
- Number of Pages:
- 6
- File Size:
- 1 file , 1.2 MB
- Note:
- This product is unavailable in Ukraine, Russia, Belarus