ASTM F744M – Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits (Metric)
1.1 This test method covers the measurement of the threshold level of radiation dose rate that causes upset in digital integrated circuits only under static operating conditions. The radiation source is either a flash X-ray machine (FXR) or an electron linear accelerator (LINAC).
Product Details
Published:
05/01/2016
Number of Pages:
7
File Size:
1 file , 170 KB
Redline File Size:
2 files , 390 KB
Note:
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