ESD SP5.3.3 – Charged Device Model (CDM) Testing – Component Level Low-Impedance Contact CDM as an Alternative CDM Characterization Method
ESD SP5.3.3-2018 establishes the procedure for testing devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined contact CDM electrostatic discharge (ESD). All packaged semiconductor devices, thin film circuits, surface acoustic wave (SAW) devices, optoelectronic devices, hybrid integrated circuits (HICs), and multi-chip modules (MCMs) containing any of these devices can be characterized according to this standard practice.
Product Details
Published:
2018
ANSI:
ANSI Approved
Number of Pages:
28
File Size:
1 file , 640 KB
Note:
This product is unavailable in Russia, Ukraine, Belarus
