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IEC 62415 Ed. 1.0 b
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Semiconductor devices – Constant current electromigration test
| Published by | Publication Date | Number of Pages |
| IEC | 05/19/2010 | 22 |
IEC 62415 Ed. 1.0 b – Semiconductor devices – Constant current electromigration test
IEC 62415:2010 describes a method for conventional constant current electromigration testing of metal lines, via string and contacts.
Product Details
- Edition:
- 1.0
- Published:
- 05/19/2010
- Number of Pages:
- 22
- File Size:
- 1 file , 910 KB
- Note:
- This product is unavailable in Ukraine, Russia, Belarus
