IEEE 1445 – IEEE Standard for Digital Test Interchange Format (DTIF)
Revision Standard – Active.The information content and the data formats for the interchange of digital test program data between digital automated test program generators (DATPGs) and automatic test equipment (ATE) for board-level printed circuit assemblies are defined. This information can be broadly grouped into data that defines the following: user under test (UUT) model, stimulus and response, fault dictionary, and probe.
Product Details
Published:
01/27/2017
ISBN(s):
9781504436915, 9781504436922, 9781504437776
Number of Pages:
64
File Size:
1 file , 1 MB
Product Code(s):
STD22392, STDPD22392, STDPL22392
Note:
This product is unavailable in Russia, Ukraine, Belarus
