IEEE 1804

IEEE 1804 – IEEE Standard for Fault Accounting and Coverage Reporting(FACR) for Digital Modules

New IEEE Standard – Active.The standard formalizes aspects of fault models as they are relevant to the generation of test patterns for digital circuits. Its scope includes (i) fault counting, (ii) fault classification, and (iii) fault coverage reporting across different ATPG (automatic test pattern generation) tools, for the single stuck-at fault model. With this standard, it shall be incumbent on all ATPG tools (which comply with this standard) to report fault coverage in a uniform way. This will facilitate the generation of a uniform coverage (and hence a uniform test quality) metric for large chips (including systems-on-chips ¿¿¿ SOCs) with different cores and modules, for which test patterns have been independently generated.

Product Details

Published:

01/31/2018

ISBN(s):

9781504443173, 9781504443180, 9781504447201

Number of Pages:

29

File Size:

1 file , 1.6 MB

Product Code(s):

STD22771, STDPD22771, STDPL22771

Note:

This product is unavailable in Russia, Ukraine, Belarus