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IEEE 300
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IEEE Standard Test Procedures for Semiconductor Charged-Particle Detectors
| Published by | Publication Date | Number of Pages |
| IEEE | 12/29/1988 | 35 |
IEEE 300 – IEEE Standard Test Procedures for Semiconductor Charged-Particle Detectors
Revision Standard – Inactive-Reserved.
Product Details
- Published:
- 12/29/1988
- ISBN(s):
- 0738106747, 9780738106748
- Number of Pages:
- 35
- File Size:
- 1 file , 460 KB
- Product Code(s):
- STDRES12286
- Note:
- This product is unavailable in Russia, Belarus
