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IEEE 660
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IEEE Standard for Semiconductor Memory Test Pattern Language
| Published by | Publication Date | Number of Pages |
| IEEE | 02/18/1986 | 14 |
IEEE 660 – IEEE Standard for Semiconductor Memory Test Pattern Language
New IEEE Standard – Inactive-Withdrawn.
Product Details
- Published:
- 02/18/1986
- ISBN(s):
- 9781504404129
- Number of Pages:
- 14
- File Size:
- 1 file , 3.3 MB
- Product Code(s):
- STDWD10413
- Note:
- This product is unavailable in Russia, Belarus
