Home JIS JIS C 2162 SALE JIS C 2162$49.00 Original price was: $49.00.$29.00Current price is: $29.00. Test method of long-term reliability of gate insulator for SiC devices at high temperaturestandard by Japanese Industrial Standard / Japanese Standards Association, 01/01/2010 JIS C 2162 quantity Add to cart PDF Format Multi-User Access Printable Online Download Category: JIS Description JIS C 2162 – Test method of long-term reliability of gate insulator for SiC devices at high temperature Product Details Published: 01/01/2010 File Size: 1 file , 630 KB Note: This product is unavailable in Russia, Ukraine, Belarus Related products ASME Y14.45 $105.00 Original price was: $105.00.$63.00Current price is: $63.00. Add to cart IPC 8413-1 $93.00 Original price was: $93.00.$56.00Current price is: $56.00. Add to cart IPC 4103B $131.00 Original price was: $131.00.$79.00Current price is: $79.00. Add to cart IPC J-STD-001H $200.00 Original price was: $200.00.$120.00Current price is: $120.00. Add to cart
JIS C 2162 – Test method of long-term reliability of gate insulator for SiC devices at high temperature Product Details Published: 01/01/2010 File Size: 1 file , 630 KB Note: This product is unavailable in Russia, Ukraine, Belarus
