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Reference sources for the calibration of surface contamination monitors — Beta-emitters (maximum beta energy greater than 0.15 MeV) and alpha-emitters (FOREIGN STANDARD) standard by Japanese Industrial Standard / Japanese Standards Association, 01/01/2005
JIS Z 4334 – Reference sources for the calibration of surface contamination monitors — Beta-emitters (maximum beta energy greater than 0.15 MeV) and alpha-emitters (FOREIGN STANDARD)
Product Details
Published:
01/01/2005
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1 file , 810 KB
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